James B. Kuo & Shih-Chia Lin 
Low-Voltage SOI CMOS VLSI Devices and Circuits 

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A practical, comprehensive survey of SOI CMOS devices and circuits
for microelectronics engineers

The microelectronics industry is becoming increasingly dependent on
SOI CMOS VLSI devices and circuits. This book is the first to
address this important topic with a practical focus on devices and
circuits. It provides an up-to-date survey of the current knowledge
regarding SOI device behaviors and describes state-of-the-art
low-voltage CMOS VLSI analog and digital circuit techniques.

Low-Voltage SOI CMOS VLSI Devices and Circuits covers the entire
field, from basic concepts to the most advanced ideas. Topics
include:

* SOI device behavior: fundamental and floating body effects, hot
carrier effects, sensitivity, reliability, self-heating, breakdown,
ESD, dual-gate devices, accumulation-mode devices, short channel
effects, and narrow channel effects

* Low-voltage SOI digital circuits: floating body effects, DRAM,
SRAM, static logic, dynamic logic, gate array, CPU, frequency
divider, and DSP

* Low-voltage SOI analog circuits: op amps, filters, ADC/DAC,
sigma-delta modulators, RF circuits, VCO, mixers, low-noise
amplifiers, and high-temperature circuits

With over 300 references to the state of the art and over 300
important figures on low-voltage SOI CMOS devices and circuits,
this volume serves as an authoritative, reliable resource for
engineers designing these circuits in high-tech industries.
€147.99
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Inhaltsverzeichnis

Preface.

Acknowlegments.

Introduction.

SOI CMOS Devices–Part I.

SOI CMOS Devices–Part II.

Fundamentals of SOI CMOS Circuits.

SOI CMOS Digital Circuits.

SOI CMOS Analog Circuits.

PD SOI-Technology SPICE Models.

Index.

Über den Autor

JAMES B. KUO, Ph D, is the NSERC Canada Research Chair Professor of
Electrical and Computer Engineering at the University of Waterloo
in Ontario, Canada. He is a Fellow of IEEE and an associate editor
of IEEE Circuits and Devices Magazine.

SHIH-CHIA LIN, Ph D, is a researcher at the University of Waterloo.
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Sprache Englisch ● Format PDF ● Seiten 424 ● ISBN 9780471464174 ● Dateigröße 26.5 MB ● Verlag John Wiley & Sons ● Erscheinungsjahr 2004 ● Ausgabe 1 ● herunterladbar 24 Monate ● Währung EUR ● ID 2328406 ● Kopierschutz Adobe DRM
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