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Christopher M Bauwens 
X-ray Scattering 

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Portada de Christopher M Bauwens: X-ray Scattering (PDF)
X-ray scattering techniques are a family of non-destructive analytical techniques which reveal information about the crystallographic structure, chemical composition and physical properties of materials and thin films. These techniques are based on observing the scattered intensity of an X-ray beam hitting a sample as a function of incident and scattered angle, polarization, and wavelength or energy. In this book, the authors present current research in the study of X-ray scattering, including real-time synchrotron X-ray scattering, applications of X-ray scattering in edible lipid systems; X-ray scattering of bacterial cell wall compounds and their neutralization and small angle X-ray scattering analysis of nanomaterials for ultra large scale integrated circuits.
€279.52
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Formato PDF ● Páginas 257 ● ISBN 9781624175060 ● Editor Christopher M Bauwens ● Editorial Nova Science Publishers ● Publicado 2007 ● Descargable 3 veces ● Divisa EUR ● ID 7222427 ● Protección de copia Adobe DRM
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