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Hans-Joachim Lenz & Ulrich Rendtel 
Adaptive Bayes’sche Stichprobensysteme für die Gut-Schlecht-Prüfung 

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Language German ● Format PDF ● ISBN 9783662110270 ● Publisher Physica-Verlag HD ● Published 2013 ● Downloadable 3 times ● Currency EUR ● ID 6343917 ● Copy protection Adobe DRM
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