This book focuses on charged-particle optics and microscopy, as well as their applications in the materials sciences. Presenting a range of cutting-edge theoretical and methodological advances in electron microscopy and microanalysis, and examining their crucial roles in modern materials research, it offers a unique resource for all researchers who work in ultramicroscopy and/or materials research.The book addresses the growing opportunities in this field and introduces readers to the state of the art in charged-particle microscopy techniques. It showcases recent advances in scanning electron microscopy, transmission electron microscopy and helium ion microscopy, including advanced spectroscopy, spherical-corrected microscopy, focused-ion imaging and in-situ microscopy. Covering these and other essential topics, the book is intended to facilitate the development of microscopy techniques, inspire young researchers, and make a valuable contribution to the field.
€124.16
भाषा अंग्रेज़ी ● स्वरूप EPUB ● ISBN 9789811304545 ● संपादक Xuedong Bai & Jing Tao ● प्रकाशक Springer Singapore ● प्रकाशित 2018 ● डाउनलोड करने योग्य 3 बार ● मुद्रा EUR ● आईडी 6792164 ● कॉपी सुरक्षा Adobe DRM
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