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Battista Biggio & Francisco Escolano 
Structural, Syntactic, and Statistical Pattern Recognition 
Joint IAPR International Workshop, S+SSPR 2016, Merida, Mexico, November 29 – December 2, 2016, Proceedings

Ondersteuning
This book constitutes the proceedings of the Joint IAPR International Workshop on Structural Syntactic, and Statistical Pattern Recognition, S+SSPR 2016, consisting of the International Workshop on Structural and Syntactic Pattern Recognition SSPR, and the International Workshop on Statistical Techniques in Pattern Recognition, SPR. The 51 full papers presented were carefully reviewed and selected from 68 submissions. They are organized in the following topical sections: dimensionality reduction, manifold learning and embedding methods; dissimilarity representations; graph-theoretic methods; model selection, classification and clustering; semi and fully supervised learning methods; shape analysis; spatio-temporal pattern recognition; structural matching; text and document analysis.
€56.64
Betalingsmethoden
Taal Engels ● Formaat EPUB ● ISBN 9783319490557 ● Editor Battista Biggio & Francisco Escolano ● Uitgeverij Springer International Publishing ● Gepubliceerd 2016 ● Downloadbare 3 keer ● Valuta EUR ● ID 6601996 ● Kopieerbeveiliging Adobe DRM
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