Since the original publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. This second treatment deals with the following outstanding recent results obtained with atomic resolution since then: force spectroscopy and mapping with atomic resolution; tuning fork; atomic manipulation; magnetic exchange force microscopy; atomic and molecular imaging in liquids; and other new technologies. These results and technologies are now helping evolve NC-AFM toward practical tools for characterization and manipulation of individual atoms/molecules and nanostructures with atomic/subatomic resolution. Therefore, the book exemplifies how NC-AFM has become a crucial tool for the expanding fields of nanoscience and nanotechnology.
Seizo Morita & Franz J. Giessibl
Noncontact Atomic Force Microscopy
Volume 2
Noncontact Atomic Force Microscopy
Volume 2
Sprache Englisch ● Format PDF ● Seiten 401 ● ISBN 9783642014956 ● Dateigröße 16.7 MB ● Herausgeber Seizo Morita & Franz J. Giessibl ● Verlag Springer Berlin ● Ort Heidelberg ● Land DE ● Erscheinungsjahr 2009 ● herunterladbar 24 Monate ● Währung EUR ● ID 2170482 ● Kopierschutz Soziales DRM