Since the original publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. This second treatment deals with the following outstanding recent results obtained with atomic resolution since then: force spectroscopy and mapping with atomic resolution; tuning fork; atomic manipulation; magnetic exchange force microscopy; atomic and molecular imaging in liquids; and other new technologies. These results and technologies are now helping evolve NC-AFM toward practical tools for characterization and manipulation of individual atoms/molecules and nanostructures with atomic/subatomic resolution. Therefore, the book exemplifies how NC-AFM has become a crucial tool for the expanding fields of nanoscience and nanotechnology.
Seizo Morita & Franz J. Giessibl
Noncontact Atomic Force Microscopy
Volume 2
Noncontact Atomic Force Microscopy
Volume 2
язык английский ● Формат PDF ● страницы 401 ● ISBN 9783642014956 ● Размер файла 16.7 MB ● редактор Seizo Morita & Franz J. Giessibl ● издатель Springer Berlin ● город Heidelberg ● Страна DE ● опубликованный 2009 ● Загружаемые 24 месяцы ● валюта EUR ● Код товара 2170482 ● Защита от копирования Социальный DRM