Logic circuits are becoming increasingly susceptible to probabilistic behavior caused by external radiation and process variation. In addition, inherently probabilistic quantum- and nano-technologies are on the horizon as we approach the limits of CMOS scaling. Ensuring the reliability of such circuits despite the probabilistic behavior is a key challenge in IC design—one that necessitates a fundamental, probabilistic reformulation of synthesis and testing techniques. This monograph will present techniques for analyzing, designing, and testing logic circuits with probabilistic behavior.
Table des matières
Introduction.- Probabilistic Transfer Matrices.- Computing with Probabilistic Transfer Matrices.- Testing Logic Circuits for Probabilistic Faults.- Signtaure-based Reliability Analysis.- Design for Robustness.- Summary and Extensions.
Langue Anglais ● Format PDF ● Pages 124 ● ISBN 9789048196449 ● Taille du fichier 5.0 MB ● Maison d’édition Springer Netherland ● Lieu Dordrecht ● Pays NL ● Publié 2012 ● Téléchargeable 24 mois ● Devise EUR ● ID 2666612 ● Protection contre la copie DRM sociale