Logic circuits are becoming increasingly susceptible to probabilistic behavior caused by external radiation and process variation. In addition, inherently probabilistic quantum- and nano-technologies are on the horizon as we approach the limits of CMOS scaling. Ensuring the reliability of such circuits despite the probabilistic behavior is a key challenge in IC design—one that necessitates a fundamental, probabilistic reformulation of synthesis and testing techniques. This monograph will present techniques for analyzing, designing, and testing logic circuits with probabilistic behavior.
विषयसूची
Introduction.- Probabilistic Transfer Matrices.- Computing with Probabilistic Transfer Matrices.- Testing Logic Circuits for Probabilistic Faults.- Signtaure-based Reliability Analysis.- Design for Robustness.- Summary and Extensions.
भाषा अंग्रेज़ी ● स्वरूप PDF ● पेज 124 ● ISBN 9789048196449 ● फाइल का आकार 5.0 MB ● प्रकाशक Springer Netherland ● शहर Dordrecht ● देश NL ● प्रकाशित 2012 ● डाउनलोड करने योग्य 24 महीने ● मुद्रा EUR ● आईडी 2666612 ● कॉपी सुरक्षा सामाजिक DRM