Weilie Zhou & Zhong Lin Wang 
Scanning Microscopy for Nanotechnology 
Techniques and Applications

Support

This book presents scanning electron microscopy (SEM) fundamentals and applications for nanotechnology. It includes integrated fabrication techniques using the SEM, such as e-beam and FIB, and it covers in-situ nanomanipulation of materials. The book is written by international experts from the top nano-research groups that specialize in nanomaterials characterization. The book will appeal to nanomaterials researchers, and to SEM development specialists.

€234.33
Zahlungsmethoden

Inhaltsverzeichnis

Fundamentals of Scanning Electron Microscopy (SEM).- Backscattering Detector and EBSD in Nanomaterials Characterization.- X-ray Microanalysis in Nanomaterials.- Low k V Scanning Electron Microscopy.- E-beam Nanolithography Integrated with Scanning Electron Microscope.- Scanning Transmission Electron Microscopy for Nanostructure Characterization.- to In-Situ Nanomanipulation for Nanomaterials Engineering.- Applications of FIB and Dual Beam for Nanofabrication.- Nanowires and Carbon Nanotubes.- Photonic Crystals and Devices.- Nanoparticles and Colloidal Self-assembly.- Nano-building Blocks Fabricated through Templates.- One-dimensional Wurtzite Semiconducting Nanostructures.- Bio-inspired Nanomaterials.- Cryo-Temperature Stages in Nanostructural Research.
Dieses Ebook kaufen – und ein weitere GRATIS erhalten!
Sprache Englisch ● Format PDF ● Seiten 522 ● ISBN 9780387396200 ● Dateigröße 23.9 MB ● Herausgeber Weilie Zhou & Zhong Lin Wang ● Verlag Springer New York ● Ort NY ● Land US ● Erscheinungsjahr 2007 ● herunterladbar 24 Monate ● Währung EUR ● ID 2145112 ● Kopierschutz Adobe DRM
erfordert DRM-fähige Lesetechnologie

Ebooks vom selben Autor / Herausgeber

3.296 Ebooks in dieser Kategorie