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Weilie Zhou & Zhong Lin Wang
Scanning Microscopy for Nanotechnology
Techniques and Applications

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Capa do Weilie Zhou & Zhong Lin Wang: Scanning Microscopy for Nanotechnology (PDF)

This book presents scanning electron microscopy (SEM) fundamentals and applications for nanotechnology. It includes integrated fabrication techniques using the SEM, such as e-beam and FIB, and it covers in-situ nanomanipulation of materials. The book is written by international experts from the top nano-research groups that specialize in nanomaterials characterization. The book will appeal to nanomaterials researchers, and to SEM development specialists.

€234.33

Tabela de Conteúdo

Fundamentals of Scanning Electron Microscopy (SEM).- Backscattering Detector and EBSD in Nanomaterials Characterization.- X-ray Microanalysis in Nanomaterials.- Low k V Scanning Electron Microscopy.- E-beam Nanolithography Integrated with Scanning Electron Microscope.- Scanning Transmission Electron Microscopy for Nanostructure Characterization.- to In-Situ Nanomanipulation for Nanomaterials Engineering.- Applications of FIB and Dual Beam for Nanofabrication.- Nanowires and Carbon Nanotubes.- Photonic Crystals and Devices.- Nanoparticles and Colloidal Self-assembly.- Nano-building Blocks Fabricated through Templates.- One-dimensional Wurtzite Semiconducting Nanostructures.- Bio-inspired Nanomaterials.- Cryo-Temperature Stages in Nanostructural Research.

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Língua Inglês ● Formato PDF ● Páginas 522 ● ISBN 9780387396200 ● Tamanho do arquivo 23.9 MB ● Editor Weilie Zhou & Zhong Lin Wang ● Editora Springer New York ● Cidade NY ● País US ● Publicado 2007 ● Carregável 24 meses ● Moeda EUR ● ID 2145112 ● Proteção contra cópia Adobe DRM

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