Weilie Zhou & Zhong Lin Wang 
Scanning Microscopy for Nanotechnology 
Techniques and Applications

Destek

This book presents scanning electron microscopy (SEM) fundamentals and applications for nanotechnology. It includes integrated fabrication techniques using the SEM, such as e-beam and FIB, and it covers in-situ nanomanipulation of materials. The book is written by international experts from the top nano-research groups that specialize in nanomaterials characterization. The book will appeal to nanomaterials researchers, and to SEM development specialists.

€234.33
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İçerik tablosu

Fundamentals of Scanning Electron Microscopy (SEM).- Backscattering Detector and EBSD in Nanomaterials Characterization.- X-ray Microanalysis in Nanomaterials.- Low k V Scanning Electron Microscopy.- E-beam Nanolithography Integrated with Scanning Electron Microscope.- Scanning Transmission Electron Microscopy for Nanostructure Characterization.- to In-Situ Nanomanipulation for Nanomaterials Engineering.- Applications of FIB and Dual Beam for Nanofabrication.- Nanowires and Carbon Nanotubes.- Photonic Crystals and Devices.- Nanoparticles and Colloidal Self-assembly.- Nano-building Blocks Fabricated through Templates.- One-dimensional Wurtzite Semiconducting Nanostructures.- Bio-inspired Nanomaterials.- Cryo-Temperature Stages in Nanostructural Research.
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Dil İngilizce ● Biçim PDF ● Sayfalar 522 ● ISBN 9780387396200 ● Dosya boyutu 23.9 MB ● Editör Weilie Zhou & Zhong Lin Wang ● Yayımcı Springer New York ● Kent NY ● Ülke US ● Yayınlanan 2007 ● İndirilebilir 24 aylar ● Döviz EUR ● Kimlik 2145112 ● Kopya koruma Adobe DRM
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