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Weilie Zhou & Zhong Lin Wang
Scanning Microscopy for Nanotechnology
Techniques and Applications

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Copertina di Weilie Zhou & Zhong Lin Wang: Scanning Microscopy for Nanotechnology (PDF)

This book presents scanning electron microscopy (SEM) fundamentals and applications for nanotechnology. It includes integrated fabrication techniques using the SEM, such as e-beam and FIB, and it covers in-situ nanomanipulation of materials. The book is written by international experts from the top nano-research groups that specialize in nanomaterials characterization. The book will appeal to nanomaterials researchers, and to SEM development specialists.

€234.33

Tabella dei contenuti

Fundamentals of Scanning Electron Microscopy (SEM).- Backscattering Detector and EBSD in Nanomaterials Characterization.- X-ray Microanalysis in Nanomaterials.- Low k V Scanning Electron Microscopy.- E-beam Nanolithography Integrated with Scanning Electron Microscope.- Scanning Transmission Electron Microscopy for Nanostructure Characterization.- to In-Situ Nanomanipulation for Nanomaterials Engineering.- Applications of FIB and Dual Beam for Nanofabrication.- Nanowires and Carbon Nanotubes.- Photonic Crystals and Devices.- Nanoparticles and Colloidal Self-assembly.- Nano-building Blocks Fabricated through Templates.- One-dimensional Wurtzite Semiconducting Nanostructures.- Bio-inspired Nanomaterials.- Cryo-Temperature Stages in Nanostructural Research.

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Lingua Inglese ● Formato PDF ● Pagine 522 ● ISBN 9780387396200 ● Dimensione 23.9 MB ● Editore Weilie Zhou & Zhong Lin Wang ● Casa editrice Springer New York ● Città NY ● Paese US ● Pubblicato 2007 ● Scaricabile 24 mesi ● Moneta EUR ● ID 2145112 ● Protezione dalla copia Adobe DRM

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