This book presents scanning electron microscopy (SEM) fundamentals and applications for nanotechnology. It includes integrated fabrication techniques using the SEM, such as e-beam and FIB, and it covers in-situ nanomanipulation of materials. The book is written by international experts from the top nano-research groups that specialize in nanomaterials characterization. The book will appeal to nanomaterials researchers, and to SEM development specialists.
€234.33
Spis treści
Fundamentals of Scanning Electron Microscopy (SEM).- Backscattering Detector and EBSD in Nanomaterials Characterization.- X-ray Microanalysis in Nanomaterials.- Low k V Scanning Electron Microscopy.- E-beam Nanolithography Integrated with Scanning Electron Microscope.- Scanning Transmission Electron Microscopy for Nanostructure Characterization.- to In-Situ Nanomanipulation for Nanomaterials Engineering.- Applications of FIB and Dual Beam for Nanofabrication.- Nanowires and Carbon Nanotubes.- Photonic Crystals and Devices.- Nanoparticles and Colloidal Self-assembly.- Nano-building Blocks Fabricated through Templates.- One-dimensional Wurtzite Semiconducting Nanostructures.- Bio-inspired Nanomaterials.- Cryo-Temperature Stages in Nanostructural Research.Buy this ebook and get 1 more FREE!
Język Angielski ● Format PDF ● Strony 522 ● ISBN 9780387396200 ● Rozmiar pliku 23.9 MB ● Redaktor Weilie Zhou & Zhong Lin Wang ● Wydawca Springer New York ● Miasto NY ● Kraj US ● Opublikowany 2007 ● Do pobrania 24 miesięcy ● Waluta EUR ● ID 2145112 ● Ochrona przed kopiowaniem Adobe DRM
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