Förstoringsglas
Sök Loader

Weilie Zhou & Zhong Lin Wang 
Scanning Microscopy for Nanotechnology 
Techniques and Applications

Stöd

This book presents scanning electron microscopy (SEM) fundamentals and applications for nanotechnology. It includes integrated fabrication techniques using the SEM, such as e-beam and FIB, and it covers in-situ nanomanipulation of materials. The book is written by international experts from the top nano-research groups that specialize in nanomaterials characterization. The book will appeal to nanomaterials researchers, and to SEM development specialists.

€234.33
Betalningsmetoder

Innehållsförteckning

Fundamentals of Scanning Electron Microscopy (SEM).- Backscattering Detector and EBSD in Nanomaterials Characterization.- X-ray Microanalysis in Nanomaterials.- Low k V Scanning Electron Microscopy.- E-beam Nanolithography Integrated with Scanning Electron Microscope.- Scanning Transmission Electron Microscopy for Nanostructure Characterization.- to In-Situ Nanomanipulation for Nanomaterials Engineering.- Applications of FIB and Dual Beam for Nanofabrication.- Nanowires and Carbon Nanotubes.- Photonic Crystals and Devices.- Nanoparticles and Colloidal Self-assembly.- Nano-building Blocks Fabricated through Templates.- One-dimensional Wurtzite Semiconducting Nanostructures.- Bio-inspired Nanomaterials.- Cryo-Temperature Stages in Nanostructural Research.
Buy this ebook and get 1 more FREE!
Språk Engelska ● Formatera PDF ● Sidor 522 ● ISBN 9780387396200 ● Filstorlek 23.9 MB ● Redaktör Weilie Zhou & Zhong Lin Wang ● Utgivare Springer New York ● Stad NY ● Land US ● Publicerad 2007 ● Nedladdningsbara 24 månader ● Valuta EUR ● ID 2145112 ● Kopieringsskydd Adobe DRM
Kräver en DRM-kapabel e-läsare

Fler e-böcker från samma författare (r) / Redaktör

3 325 E-böcker i denna kategori